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Quality Warranty

Part Test By Samsung-Capacitors Include

HD Visual Inspection
High Definition Appearance testing including Silk screen, coding, High Definition detect solder balls, which can detect whether Oxidized and original parts.
Final Function Testing
During a functional test the voltage level of the output signals from the DUT are compared to the VOL and VOH reference levels by the functional comparators. An output strobe is assigned a timing value for each output pin to control the exact point within the test cycle for sampling the output voltage.
Open/Short Test
The opens/shorts test(also called continuity or contact test) verifies that, during a device test, electrical contact is made to all signal pins on the DUT and that no signal pin is shorted to another signal pin or power/ground.
Programming Function Testing
To exam the read,erase and program function as well as blank checking for chips including digital memory,Microcontrollers,MCU and so on
X-RAY And ROHS Test
X-RAY can confirm whether the wafer and wire bond and die bond is good or not ; the ROHS test is via the environmental protection of the product pin and lead content of the solder coating by the photovoltaic equipment
Chemistry Analysis
Verified product is original by chemical analysis

Test Lab Scenes